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Laser Beam Profiler, 190nm-1150nm

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Key Features
  • Wavelength options: 190nm -1150 nm, 650-1800 nm, 800-2500 nm, 190-2500 nm
  • Scanned beam diameters: 2.0 µm to 4 mm (2 mm for IGA-X.X)
  • X-Y Profile & Centroid Resolution: 0.1 µm or 0.05% of scan range
  • Profile & Centroid Accuracy: +/- <2% +/- <0.5µm
  • CW, Pulsed > 100 kHz, high duty cycle

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MODEL BMS2-CM
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Wavelength
  • Si detector: 190 to 1150 nm
  • InGaAs detector: 650 to 1800 nm
  • Si + InGaAs detectors: 190 to 1800 nm
  • Si + InGaAs (extended) detectors: 190 to 2300 or 2500 nm
Applications
  • Laser & Laser Assembly Verification
  • Lens Focus Testing for short focal lengths
  • Fiber Optic Telecom assembly focusing

Product Overview:

DataRay, Inc scanning slit laser beam profiler optional wavelength range coverage from 190nm to 2500nm. Designed for final test in production environments with high accuracy and easy to use software.

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